Abstract:Transparent materials are widely used in industrial applications, such as construction, transportation, and optics. However, the complex optical properties of these materials make it difficult to achieve precise surface form measurements, especially for bulk surface form inspection in industrial environments. Traditional structured light-based measurement methods often struggle with suboptimal signal-to-noise ratios, making them ineffective. Currently, there is a lack of efficient techniques for real-time inspection of such components. This paper proposes a single-frame measurement technique based on deflectometry for large-size transparent surfaces. It utilizes the reflective characteristics of the measured surface, making it independent of the surface's diffuse reflection properties. This fundamentally solves the issues associated with signal-to-noise ratios. By discretizing the phase map, it separates the multiple surface reflection characteristics of transparent devices, enabling transparent device measurement. To meet the requirements of industrial dynamic measurement, this technique only needs a simple and low-cost system structure, which contains just two cameras for image capture. It does not require phase shifting to complete the measurement, making it independent of the screen and having the potential for larger surface measurement. The proposed method was used to measure a 400mm aperture automobile glass, and the results showed that it is able to achieve a measurement accuracy on the order of 10 μ m. The method proposed in this paper overcomes the influence of surface reflection on transparent objects and significantly improves the efficiency and accuracy of large-sized transparent surface measurements by using a single-frame image measurement. Moreover, this method shows promise for broader applications, including measurements of lenses and HUD (Heads-Up Display) components, showcasing significant potential for industrial applications.

Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy

Low Noisy Dual Wavelength Digital Holography and Application in the Ultra-precision Machining Surface Measurement

Surface defects evaluation system based on electromagnetic model simulation and inverse-recognition calibration method

A high-resolution detecting system based on machine vision for defects on large aperture and super-smooth surface

Single-exposure cepstrum phase-shifting in-line digital holography based on dual-CCD

Near Common-Path Optical Fiber Interferometer for Potentially Fast On-Line Microscale-Nanoscale Surface Measurement

Quantitative Phase Imaging Based on Wavefront Correction of a Digital Micromirror Device

Selection of Phase-Recovery Algorithms for Fringe Processing in Optical Measurement of Micro-Surface

Fast Surface Measurement Using Wavelength Scanning Interferometry with Compensation of Environmental Noise

Fast Measurement of Surface Topographies Using a Phase-Measuring Deflectometric Microscopy

The Microstructure Measurement of Surface Defects of Optical Component Based on Digital Image-Plane Holographic Microscopy

Quantitative Measurement for the Structure of Defects on Optical Surface with Lensless Fourier Transform Digital Holographic Microscopy

Accurate Reconstruction in Measurement of Micro-Structures Using Digital Holographic Microscopy

Synchronous Phase-Shifting Interference for High Precision Phase Imaging of Objects Using Common Optics

Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy

Accurate reconstruction in digital holographic microscopy using antialiasing shift-invariant contourlet transform

Correction of Phase-Shifting Error in Wavelength Scanning Digital Holographic Microscopy

A Novel Approach for Measurement of Free-Form Optical Elements with Digital Holographic Microscopy

A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components

Fast and accurate phase processing in off-axis digital holography combining adaptive spatial filtering and an embedded GPU platform

A Novel Wafer Defocus Measurement Method for Spot-Scanning Imaging System Using Laser Triangulation