Abstract:Quantifying local structure is critical to understand and control material properties.While pair distribution function techniques from diffraction are commonly used to investigate the average local structure of a material, these approaches are limited by the lack of chemically and spatially resolved details.While electron microscopy exhibits superior spatial resolution, accurate determination of structure has been limited by imprecise knowledge of the illuminating and diffraction conditions (parallel beam) or sample drift (STEM).In contrast, the revolving STEM (RevSTEM) method introduces scan rotation between a series of fast-acquisition STEM images to encode the information about sample drift and leads to near distortion-free imaging after post-processing [1].In this talk, we will discuss how RevSTEM imaging can be made highly accurate and precise for local structure determination.Beyond drift, we will also show that the scan system axes are not orthonormal, resulting a 'global residual distortion' which must be calibrated to achieve accuracy [2].We will demonstrate and explain how to accurately and precisely remove this distortion.This is achieved using measurement of the projected-PDF (P-PDF) by locating and calculating the distance between all n th nearest neighbors (Figure 1a) [3].We will show how the standard deviation of each n th near neighbor distance can then be used to determine the coefficients of the calibration transformation matrix (Figure 1b):. Using well-calibrated RevSTEM imaging, we will then show how this approach opens new avenues to characterize local structure in complex oxide materials.Multiple case studies for complex oxides will be presented, including thin film and bulk materials [4].For example, we will show how picometer precise measurements enable the capability to directly observe static atomic displacements within a complex oxide solid solution exhibiting differences in local bonding (Figure 2a).We will also explore how local deviations from cubic symmetry can be observed in the oscillations of the standard deviations from the P-PDF (Figure 2b).Finally, we will discuss the application of application of spatial statistics, such as Bayesian classifiers, to explore the connection between local chemistry and structure [5].

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Distinguishing Elements at the Sub-Nanometer Scale on the Surface of a High Entropy Alloy

Spatially Resolved Distribution Function and the Medium-Range Order in Metallic Liquid and Glass

Unveiling the Local Atomic Arrangements in the Shear Band Regions of Metallic Glass

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

Local Crystallography for Quantitative Analysis of Atomically Resolved Images