Abstract:The problem of fault classification in industry has been studied extensively. Most classification algorithms are modeled on the premise of data balance. However, the difficulty of collecting industrial data in different modes is quite different. This inevitably leads to data imbalance, which will adversely affect the fault classification performance. This article proposes a novel data augmentation classifier (DAC) for imbalanced fault classification. Data augmentation based on generative adversarial networks (GANs) is an effective way to solve the problem of unbalanced classification. However, the randomness of the GAN generation process restricts the effect of data enhancement. DAC proposes a data selection strategy based on data filtering and data purification in model training to solve this problem. In addition, DAC combines supervised learning and data generation processes to obtain an end-to-end model. Meanwhile, multigenerator structure of DAC (MDAC) is proposed to solve the problem of incomplete learning of a single generator when data imbalances get complicated. The proposed DAC and MDAC are applied in two fault classification cases of the Tennessee Eastman (TE) benchmark process, results of which show superiority of DAC and MDAC compared to existing methods. Note to Practitioners-Data imbalances are common in fault classification and affect the effectiveness of modeling in industry. As a generative model, generative adversarial networks (GANs) provide new ideas for small-class data augmentation. However, the instability of its training process and the randomness of data generation affect the results of data augmentation. In this article, the GAN generation process is analyzed in detail. The results of the visualization indicate that no data generation was perfect at any one time. Based on the rules of GAN data generation, we propose a data selection strategy during training. High-quality data are selected for data augmentation through data filtering and data purification. Apart from this, we combine the training process of GAN and classification model for imbalanced data to reduce modeling time. Through industrial examples, we have evaluated the effectiveness of this method.

A Class Imbalanced Wafer Defect Classification Framework Based on Variational Autoencoder Generative Adversarial Network

A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification

Deep Convolutional Generative Adversarial Networks-Based Data Augmentation Method for Classifying Class-Imbalanced Defect Patterns in Wafer Bin Map

A Model for Generating Wafer Defect Maps

Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network

Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation

Data Augmentation Classifier for Imbalanced Fault Classification

Focal Auxiliary Classifier Generative Adversarial Network For Defective Wafer Pattern Recognition With Imbalanced Data

Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects

Multiple Granularities Generative Adversarial Network for Recognition of Wafer Map Defects

One-Class Classification for Wafer Map using Adversarial Autoencoder with DSVDD Prior

Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model

A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

Deep Transfer Wasserstein Adversarial Network for Wafer Map Defect Recognition

Wafer map defect patterns classification based on a lightweight network and data augmentation

Deep Learning Approach for Defective Spot Welds Classification Using Small and Class-Imbalanced Datasets.

A voting-based ensemble feature network for semiconductor wafer defect classification

Network intrusion detection based on conditional wasserstein variational autoencoder with generative adversarial network and one-dimensional convolutional neural networks

VAE-WACGAN: An Improved Data Augmentation Method Based on VAEGAN for Intrusion Detection

Wafer Bin Map Recognition with Autoencoder-based Data Augmentation in Semiconductor Assembly Process

Defect Reconstruction for Class-imbalanced Power System Defect Recognition