Atomic multiplet calculation of 3d_{5/2} -> 4f resonant x-ray diffraction from Ho metal
M. W. Haverkort,C. Schüßler-Langeheine,C. F. Chang,M. Buchholz,H.-H. Wu,H. Ott,E. Schierle,D. Schmitz,A. Tanaka,L. H. Tjeng
DOI: https://doi.org/10.48550/arXiv.0805.4341
2008-05-28
Abstract:We compare for Ho metal the x-ray absorption spectrum and the resonant soft x-ray diffraction spectra obtained at the $3d_{5/2} \to 4f$ ($M_5$) resonance for the magnetic 1st and 2nd order diffraction peaks $(0,0,\tau)$ and $(0,0,2\tau)$ with the result of an atomic multiplet calculation. We find a good agreement between experiment and simulation giving evidence that this kind of simulation is well suited to quantitatively analyze resonant soft x-ray diffraction data from correlated electron systems.
Strongly Correlated Electrons