Multi-objective Optimization Hardening Design for Multiplier Circuit

Chao Chen,Yan Li,Xu Cheng,Jun Han,Xiaoyang Zeng
DOI: https://doi.org/10.1109/icsict55466.2022.9963352
2022-01-01
Abstract:Soft error has been a major reliability issue in advanced technology nodes. Mitigating soft error rate (SER) will bring great area and power overhead inevitably. This paper makes several improvements to a multi-objective optimization framework based on Bayesian optimization. A scheme incorporating Affinity Propagation (AP) and a novel sorting algorithm is proposed to cluster and sort the flip-flops (FFs), which ensures that the framework is suitable for large-scale circuit design. Results show that the scheme proposed in this paper performs better than the reference work. By employing the framework on multiplier hardening designs, a 78.3% reduction in SER is achieved with an acceptable increase in area and power consumption.
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