Sub-micron normalized emittance measurement for a MeV continuous-wave electron gun

Tao Tan,Haoyan Jia,Sheng Zhao,Tianyi Li,Tianyi Wang,Zhongqi Liu,Xiang Zhang,Senlin Huang,Lin Lin,Liwen Feng,Huamu Xie,Shengwen Quan,Kexin Liu
DOI: https://doi.org/10.1016/j.nima.2022.167552
2023-01-01
Abstract:Continuous-wave (CW) electron sources with sub-micron normalized emittance are of critical importance for advanced linear accelerator based light sources. The DC-SRF-II gun, designed as such a source, has been newly constructed and brought into operation. To characterize the performance of the gun, we have developed an emittance measurement system based upon single slit scanning method under a dedicated beam diagnostics mode. With this system, the measurement of sub-micron normalized emittance, together with a reconstruction of the phase space distribution, has been achieved with high reproducibility. This paper presents a detailed description of the system.
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