Abstract:Scan-based Design-for-testability (DfT) is the de facto standard in the semiconductor testing industry to guarantee the functional and structural correctness of chips. It provides improved observability and controllability, leading to enhanced fault coverage. However, owing to widespread usage, attackers devise techniques to misuse this method to steal secret keys embedded in a security-critical chip. A vast majority of off-the-shelf defense mechanisms are based on either randomizing the scan output or restricting access to the scan. However, none of these defense mechanisms leverage the fundamental properties of the scan attack; thus, they tend to be complex and incur high area and computation overhead. In this paper, we propose a defense mechanism by preventing the vulnerabilities of fundamental properties from being exploited in scan attacks. The paper first pinpoints the ultimate condition of the scan attack on Advanced Encryption Standard (AES). This attack condition is inherent to the cryptographic property of the cipher, which, when violated, thwarts the attack. To implement our defense, we interchange the AES round outputs by applying pre-computed masks. The designer chooses inputs with a fixed difference to swap the outputs. A modified incorrect key is recovered instead of an actual key if a scan-based attack is launched. To show the generality of the proposed defense, it is extended to another AES-like cipher, Light Encryption Device (LED). To the best of our knowledge, this is the first defense against a scan attack wherein the complete testing process, including structural and functional tests, can be outsourced to untrusted third parties without compromising the actual key. In comparison, logic locking techniques limaye2020thwarting can outsource only structural testing to untrusted third parties.

Building Hardware Security Primitives Using Scan-based Design-for-Testability

A Secure Scan Method for Crypto Chips

How to Secure Scan Design Against Scan-Based Side-Channel Attacks?

Balancing Testability and Security by Configurable Partial Scan Design.

Partial Scan Design Against Scan-Based Side Channel Attacks.

A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash

A Secure DFT Architecture Protecting Crypto Chips Against Scan-Based Attacks

Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware

Why Current Secure Scan Designs Fail and How to Fix Them?

Intellectual property authentication by watermarking scan chain in design-for-testability flow

An Obfuscation Scheme of Scan Chain to Protect the Cryptographic Chips.

Secure Scan and Test Using Obfuscation Throughout Supply Chain.

A New Countermeasure Against Scan-Based Side-Channel Attacks

A Low-overhead PUF-based Secure Scan Design

Security Problems of Scan Design and Accompanying Measures

Scan Chain Based IP Fingerprint and Identification

A Memristor-based Secure Scan Design Against the Scan-based Side-Channel Attacks

DefScan : Provably Defeating Scan Attack on AES-Like Ciphers

A Low-Overhead Dynamic Watermarking Scheme on Scan Design for Easy Authentication.

A New Secure Scan Design with PUF-based Key for Authentication

An improved publicly detectable watermarking scheme based on scan chain ordering