Abstract:Most VLSI watermarking techniques do not allow different authorships of multiple Intellectual Property (IP) cores to be detected directly in the field after the IPs have been integrated, fabricated and packaged into chip. Watermark inserted at the design-for-testability (DfT) stage makes its direct detection after chip packaging possible, but it protects only the downstream placement-and-routing design, and is vulnerable to removal attack as the test logic is independent of the functional logic. In this paper, we propose a publicly detectable watermarking scheme to bridge the gap between IP protection and IP management. The design is watermarked by means of synthesis-for-testability (SfT), where the test and functional logics of the IP are merged and synthesized together without using scannable flip-flops. Watermarked constraints are imposed on the scan chain ordering problem in the SfT process so that ownership of the embedded IP can be publicly identified by lawful IP providers, buyers and consumers by injecting a specific test vector in the field. The overhead due to the watermark insertion is minimized by a nearest neighbor search algorithm for flip-flop reordering. As the scan function is an integral part of the design in the synthesis process of the IP creation, the watermark is harder to be removed relative to other scan chain watermarking schemes whose test circuits are logically independent of the IP functionality. To deter and track IP fraudulence by the licensees, a provable mechanism is proposed to enable multiple authorships of different IP cores in a single chip to be publicly authenticated in the field. Experiments performed with ISCAS89 and LGSyn93 benchmark circuits show that the proposed watermarked designs have low design overheads, and the probabilities of coincidence and removal reduce rapidly with increased watermark and scan chain length.

A Low-Overhead Dynamic Watermarking Scheme on Scan Design for Easy Authentication.

Design and Implementation of a Watermarking Algorithm for Image Authentication

Intellectual property authentication by watermarking scan chain in design-for-testability flow

Ultra-Low Overhead Dynamic Watermarking on Scan Design for Hard IP Protection

An improved publicly detectable watermarking scheme based on scan chain ordering

A New Watermarking Scheme on Scan Chain Ordering for Hard IP Protection.

A Watermarking Algorithm for Image Content Authentication in Double-Compression Environment

A Hybrid Watermarking Scheme for Sequential Functions.

A Watermarking Scheme Based on Rotating Vector for Image Content Authentication

Synthesis-for-Testability Watermarking for Field Authentication of VLSI Intellectual Property

A Post-Processing Scan-Chain Watermarking Scheme For Vlsi Intellectual Property Protection

A Lossless Watermarking Scheme for Halftone Image Authentication

A New Watermarking Scheme Robust to Print-and-Scan

A Robust FSM Watermarking Scheme for IP Protection of Sequential Circuit Design

A Hidden DCT-Based Invisible Watermarking Method for Low-Cost Hardware Implementations

Building Hardware Security Primitives Using Scan-based Design-for-Testability

A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash

A Semi-Fragile Reversible Watermarking for Authenticating 2D Engineering Graphics Based on Improved Region Nesting

A Robust Dynamic Watermarking Scheme Based on STBDW

A Novel Watermarking-Based Reversible Image Authentication Scheme

A Watermarking Technique for Hard IP Protection in Full-custom IC Design