Electrical Edge Effect Induced Photocurrent Overestimation in Low-Light Organic Photovoltaics

Xiaobo Zhou,Chao Zhao,Awwad Nasser Alotaibi,Hongbo Wu,Hafiz Bilal Naveed,Baojun Lin,Ke Zhou,Zaifei Ma,Brian A. Collins,Wei Ma
DOI: https://doi.org/10.1016/j.joule.2022.06.008
IF: 46.048
2022-01-01
Joule
Abstract:In many literatures, the short-circuit current (JSC) of indoor organic photovoltaics is overestimated, leading to severely wrong device performance evaluation and analysis. In this work, based on the equivalent circuit model, we demonstrate that electrical edge effect is sensitive to both transverse surface resistance and light intensity. At low light intensity, the electrical edge effect could lead to JSC being significantly overestimated, i.e., by 100% and even more. We show that for a PM6:Y6 device capped with a MoOX layer, when measured under 0.01 sun, the usually overlooked interface doping mechanism would lead to JSC and PCE overestimation by 51% and 15%, respectively. Besides, we show that the magnitude of JSC overestimation drastically increases with high photoactive-layer surface roughness. This work emphasized the significant electrical edge effect on JSC evaluations for low-light solar cells and is conducive to understanding the intrinsic mechanism of edge effect, promoting a healthier development of organic photovoltaics.
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