Strain controllable band alignment, interfacial and optical properties in tellurene/GaAs van der Waals heterostructures
Gen Li,Hairui Bao,Yange Peng,Xi Fu,Wenhu Liao,Changqing Xiang
DOI: https://doi.org/10.1039/d4cp00560k
IF: 3.3
2024-05-18
Physical Chemistry Chemical Physics
Abstract:By using the first principles calculations, we theoretically investigate the electronic structures, interfacial properties, and optical properties of the two-dimensional van der Waals heterostructures (vdWHs), i.e., α-Te/GaAs and γ-Te/GaAs, formed by tellurene (Te) and GaAs monolayers. It has been demonstrated that, the semiconductor-semiconductor contacted α-Te/GaAs vdWH exhibits a type-II band alignment with a direct band gap of 0.28 eV while the metal-semiconductor contacted γ-Te/GaAs vdWH owns a p-type Schottky contact with a Schottky barrier height (SBH) of 0.36 eV at the interface. The transition from type-II to type-III band alignment is observed firstly in α-Te/GaAs vdWH when the in-plane biaxial strain is less than -5.2% and larger than 4.4%, meanwhile, the p-type Schottky contact to Ohmic contact transition may be realized in γ-Te/GaAs vdWH when the in-plane biaxial strain is less than -2.4%. Finally, the maximum optical absorption coefficients of the α- and γ-Te/GaAs vdWHs have been observed up to 31% and 29%, respectively, as may be modulated effectively by the in-plane biaxial strain. The obtained results may be of importance in the design of the nanoelectronic devices based on the proposed tellurene/GaAs vdWHs.
chemistry, physical,physics, atomic, molecular & chemical