Abstract:Since their discovery in 1981, quasicrystals have challenged traditional crystallography, showcasing the diversity of material structures. Quasicrystals are ordered structures in higher-dimensional Cartesian coordinate systems projected into lower dimensions. Exploring whether materials can grow into high-symmetry ordered structures in different mathematical coordinate systems is an intriguing topic. This paper reports a new crystallization growth mode in InSiO thin films, exhibiting high symmetry in spherical and cylindrical coordinate systems, named cylindrical symmetric rotating crystals (CSRC). These crystals show rotational symmetry in their lattice structure, consistent with cylindrical symmetry. They are also part of spherical crystals, which theoretically have one of the highest symmetries. Theoretical predictions suggest that a two-dimensional slice of a spherical crystal in conventional grating mode SEM images will display relatively complete Kikuchi patterns due to the wave properties of incident electrons, unlike crystals or quasicrystals, which show surface morphology from the particle properties of incident electrons. We formed InSiO CSRC by heating InSiO amorphous films and observed relatively complete Kikuchi patterns that quantitatively relate to the incident electron beam direction and energy. These findings align with theoretical predictions, indicating that the Kikuchi patterns in SEM images result from Bragg diffraction through coherent electron scattering within the crystals. Quantitative analysis of these patterns provides information on the lattice structure, constants, crystal orientation, stress information, defect concentration, and Brillouin zone of the InSiO material. This method of obtaining microstructural information directly from SEM images applies only to CSRC, not to conventional or quasicrystal samples.

Banach fixed-point between SEM image and EBSD diffraction pattern from a cylindrically symmetric rotating crystal

Cylindrically Symmetric Rotating Crystals Observed in Crystallization Process of InSiO Film

A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Regulating Electron Diffraction Direction with Cylindrically Symmetric Rotating Crystal

Microdiffraction phase identification in the scanning electron microscope (SEM)

Indexation of electron diffraction patterns at grain boundaries

Exploring High-Symmetry Structures in Non-Cartesian Coordinates: Preparation and Characteristics of Cylindrically Symmetric Rotating Crystals

EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Observations of specimen morphology effects on near‐zone‐axis convergent‐beam electron diffraction patterns

Identifying rotational symmetry axes in Kikuchi patterns by reciprocal vectors

The observation of crystalline materials in the scanning electron microscope (SEM)

Bohmian Trajectory-Bloch Wave Approach to Dynamical Simulation of Electron Diffraction in Crystal

Objective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Metric

EBSD patterns simulating multilayer twins based on dynamical theory of electron diffraction

Improved High-Resolution EBSD Analyses by Correcting Radial Distortion of Electron Diffraction Patterns

Diffraction contrast in reflection electron microscopy—I. Screw dislocation

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment

Observation of kagome-like bands in two-dimensional semiconducting Cr8Se12