A Free Reflection Surface Based on Zernike Polynomial for Passive Millimeter Wave Imaging

Pengcheng Wang,Nannan Wang,Xueying Wang,Oleksandr Denisov,Qian Song,Jinghui Qiu
DOI: https://doi.org/10.1109/icmmt52847.2021.9618354
2021-01-01
Abstract:In this paper, the impact of the imaging system's focus characteristics. Passive millimeter wave imaging systems often use focal plane arrays and ellipsoidal reflective surfaces. The ellipsoid reflecting surface will cause focal spot distortion during the offset feed, which will adversely affect the resolution of the imaging system. To solve this problem, based on the W-band passive millimeter wave imaging system, this paper combines optical imaging theory and millimeter wave imaging theory to design a free-form surface based on Zernike polynomial to improve focal spot distortion. Using Zernike surface in this system, the resolution accuracy is increased by 29mm when the offset is 3.6°, and the resolution accuracy is increased by 11mm when the offset is 6.9°.
What problem does this paper attempt to address?