Automatic Characterization Method for the Quasi-Planar Freeform Surface by Atmospheric Pressure Plasma Processing

Peng Ji,Duo Li,Yuan Jin,Bo Wang
DOI: https://doi.org/10.1117/12.2617519
2022-01-01
Abstract:With the vertical fluctuation of small amplitudes, the quasi-planar freeform surface is essentially a plane superposed by microstructure with several micrometers. In practical, it’s widely used to improve the optical performance. However, its form accuracy highly depends on the processing iteration with all kinds of computer controlled optical surfacing (CCOS) technology. This paper presents an automatic characterization method for the quasi-planar freeform surface by atmospheric pressure plasma processing (APPP). Firstly, the principle of APPP and fabrication of the typical quasi-planar freeform surface are introduced. Based on this, an automatic characterization method is developed to eliminate the misalignment between the measured and designed surface, which serves for the form error evaluation and removal generation of next processing step. Finally, the simulation and experiment were conducted to demonstrate the effectiveness of the proposed method, which indicates that it can provide the reliable feedback for the fabrication of quasi-planar freeform surface.
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