Abstract:Issues related to energy and the environment have now become of central and crucial importance in our societies. Low‐carbon green energy will have a critical role in a necessary third industrial revolution. To reduce global greenhouse gas emissions in response to globalization and increasingly stringent carbon emission policies, large scale green energy production technologies must be established worldwide. A new age of human demand for green energy is thus coming and scientists are focused on finding new functional efficient and low‐cost materials to generate clean and sustainable energy. Improving the energy conversion, generation, and storage efficiency of energy materials has always been a daunting challenge. For many important energy material systems, such as nanostructured catalysts, artificial photosynthetic systems, smart energy saving materials, and energy storage devices, monitoring the atomic and electronic structures close to the interfacial region in a real working environment is of paramount importance. Designing a better‐performing material without comprehending its fundamental properties such as chemical states, atomic and electronic structures and how they are altered close to the interfacial regions during the physical and chemical reactions involved in their applications is very challenging. Understanding, controlling and tuning the interfaces in energy conversion and storage materials requires in situ/operando characterization tools, of which synchrotron X‐ray spectroscopies, which have several unique features, are very suitable ones. X‐ray absorption spectroscopy can be used to elucidate the local unoccupied electronic structure in the conduction band, and X‐ray emission spectroscopy can be used to characterize the occupied electronic structure in the valence band. The derived resonant inelastic X‐ray scattering reveals inter‐ and/or intra‐electric transitions (i.e. d–d, f–f excitation and charge‐transfer excitation) that reflect intrinsic chemical and physical properties. Scanning transmission X‐ray microscopy is a chemical mapping technique with elemental sensitivity and spatial selectivity, which can therefore yield information about chemical composition in various spatial regions. This unique characteristic makes the method effective for investigating interfacial phenomena (such as electron transport, interface formation/deformation, defects, doping etc.). In situ/operando approaches have made the probing and understanding of changes in the atomic and electronic structures of energy materials in an operational environment feasible. This article presents a perspective of the pioneering developments as well as the recent achievements in in situ/operando synchrotron X‐ray spectroscopies for the advanced investigation of energy materials. Four major energy material systems are identified: energy storage, energy generation, energy conversion, and energy saving material systems. Selected representative investigations of each systems are showcased and discussed demonstrating that in situ/operando synchrotron X‐ray spectroscopy is truly essential for unraveling better fundamental knowledge for mechanism understanding and efficiency optimization of existing and emerging energy material systems.

Characterization of Polymer Materials by Synchrotron Radiation Hard X-ray Scattering Technology: The Development and Application of in situ Instruments

Wide Angle X-Ray Scattering to Study the Atomic Structure of Polymeric Fibers

In Situ Synchrotron Radiation Techniques: Watching Deformation-induced Structural Evolutions of Polymers

Application of synchrotron radiation microscopy in the study of polymer materials

Multiscale Characterization of Semicrystalline Polymeric Materials by Synchrotron Radiation X‐ray and Neutron Scattering

Polymers and Soft Materials

In-situ Temperature-Controllable Grazing Incidence X-ray Scattering of Semiconducting Polymer Thin Films under Stretching

An <i>in situ</i> shearing x-ray measurement system for exploring structures and dynamics at the solid-liquid interface

In situ X-ray diffraction and thermal simulation of material extrusion additive manufacturing of polymer

A Novel Apparatus Combining Polymer Extrusion Processing and X-Ray Scattering

Application of Synchrotron-Based High-Energy X-Ray Diffraction in Materials Research

Probing Morphology and Chemistry in Complex Soft Materials with in Situ Resonant Soft X-Ray Scattering

The Application of X-ray and Neutron Scattering Techniques in the Characterization of Molecular Clusters and Their Polymer Composites

Recent Advances in Post-Stretching Processing of Polymer Films with in Situ Synchrotron Radiation X-ray Scattering

A stretching apparatus with broad strain rate and temperature ranges for in-situ x-ray scattering measurements of polymers

Characterization Tools for Polymer Thin Films

A Versatile Biaxial Stretching Device for in Situ Synchrotron Radiation Small- and Wide-Angle X-Ray Scattering Measurements of Polymer Films.

In Situ/Operando X‐ray Spectroscopies for Advanced Investigation of Energy Materials

High-Throughput in Situ Characterization of Polymer Crystallization under an Intense Flow, High Pressure, and Cooling Gradient during Injection Molding

A multi-mode stretching apparatus for in situ synchrotron x-ray scattering of polymer materials

Extensional Rheometer for in Situ X-Ray Scattering Study on Flow-Induced Crystallization of Polymer