Optical Film Damage Classification Based on Neural Network

Guoliang Yang,Junhong Su,Wenbo Huang,Gaohan Zhou,Yuan Li
DOI: https://doi.org/10.1142/s0218001422500240
IF: 1.261
2022-01-01
International Journal of Pattern Recognition and Artificial Intelligence
Abstract:Traditional machine learning requires users to have a strong ability to control features and distance calculation formulas, especially in the use of support vector machine SVM and nearest neighbor KNN. Traditional machine learning uses PCA in feature extraction will actually lead to Information is lost. In order to solve the problem of low optical film damage detection rate of traditional methods, a new method is proposed in this paper based on a convolutional neural network instead of traditional machine learning to classify CCD images with different damage degrees of SiO2 film and K9 glass. First, film images are collected by online CCD, and the proposed algorithm is designed to extract the image characteristic parameters of the film microscopic images, filter denoising, and run binarization to analyze film images. Second, gray values of images are extracted and classified by unsupervised learning. Finally, the film microscopic images under the microscope are analyzed. The experimental results show that the defect positions on the images can be detected after the images are detected and processed by a convolution neural network, binarization, and connected domains. The defective parts can be intercepted from the images, and the data related is saved for damage type determination. The average classification rate is over 99%, which is better than the traditional method by 9.1%. Therefore, it has a high application value.
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