Towards Achieving a Large-Area and Defect-Free Nano-Line Pattern Via Controlled Self-Assembly by Sequential Annealing

Tao Wen,Bo Ni,Yuchu Liu,Wei Zhang,Zi-Hao Guo,Yi-Chien Lee,Rong-Ming Ho,Stephen Z. D. Cheng
DOI: https://doi.org/10.1016/j.giant.2021.100078
2021-01-01
Giant
Abstract:Utilizing the controlled self-assembling of a giant surfactant, a bottom-up method for constructing line gratings with sub-10 nm resolution has been developed. Via a simple solvent vapor annealing procedure, the giant surfactant comprised of an oligomeric silsesquioxane (DPOSS) and polystyrene (PS) tail (i.e., DPOSS-PS) has been precisely self-assembled into perpendicularly oriented lamellae structures. A follow-up thermal annealing further significantly promotes the long-range ordering, giving rise to highly oriented and defect-free sub-10 nm line patterns (up to areas of several µm2). The solvent evaporation and thermal annealing process, together with the strong segregation strength (χN) of DPOSS-PS, play crucial roles in the self-orientation and width-reduction of the line patterns. This simple processing of the easy-accessed giant surfactants results in a facile and more economic approach for large-scale nano-sized line grating fabrication.
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