Abstract:Direct X-ray detectors, which directly convert X-rays into electrical signals through semiconductors, have higher space solution than scintillator-mediated indirect X-ray ones and are high desirable for early cancer detection and other applications, but the mainstream commercial alpha-Se detector is still largely limited by high production costs, large leakage current and low stability. This article reports an easily prepared, stable radiochromic semiconductive metal-organic framework (MOF), (MV)[Cd3 (tdc)4 ] center dot 2H2 O (RCS-1, H2 tdc = 2,5-thiophenedicarboxylic acid; MV2 + = methyl viologen cation) with direct X-ray detecting ability. With a large bulk resistivity of 8.40 x 109 S2 cm, this material ensures minimal dark current and low noise for X-ray detection. Additionally, it exhibits higher sensitivity to W K alpha X-rays (98.58 mu C Gy-1 cm-2 ) than alpha-Se ( similar to 20 mu C Gy-1 cm-2 ). Meanwhile, unlike most reported direct X-ray detecting semiconductors, compound RCS-1 shows remarkable color change upon X-ray irradiation owing to the presence of photochromism-active viologen cations. This feature offers an appealing visual detecting ability to direct X-ray detectors that provide only the electrical signals. (c) 2024 Published by Elsevier B.V. on behalf of Chinese Chemical Society and Institute of Materia Medica, Chinese Academy of Medical Sciences.

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