Thickness Measurements by Electron Energy Loss Spectroscopy (EELS)

Ruoya Ho,Lijie Zhao,Yun-Yu Wang,Zhifeng Shao,Andrew P. Somlyo
DOI: https://doi.org/10.1017/s0424820100148009
1993-01-01
Abstract:An estimate of specimen mass-thickness is an essential requirement for evaluate with EELS the absolute elemental concentration in biological specimens. The conventional method used for measuring specimen thickness by EELS is: where t is the specimen thickness, λi is the total inelastic mean free path, It is the total count in an EELS spectrum and I0 is the count in the zero loss peak. This equation is rigorously correct, only if the electrons are collected over all scattering angles and the spectrum covers all energy losses. But in most experiments with a finite energy loss region, because of the limited collection semi-angle, we can only collect a fraction of scattered electrons. Omitting the high loss electrons will result in a cut-off error that is usually less than 5%, if we use an energy window from 0 eV to 150 eV or above. But the effect of the limited semi-angle is more serious. Fig. 1 shows the ln(It/I0) measured on the same specimen in both TEM and STEM mode at 80 keV with a magnetic sector spectrometer equipped with a parallel detector on Philips 400 FEG.
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