Abstract:The Ti-in-zircon thermometer is widely used in geoscience for constraining the temperatures of geological settings. Precise and accurate determination of Ti contents (one to tens of μg g−1) in zircon is a prerequisite for the application of this thermometer; however, traditional laser ablation–single quadrupole–inductively coupled plasma–mass spectrometry (LA–SQ–ICP–MS) analysis of Ti contents in zircon is challenging due to the low relative abundance of the interference-free isotope (49Ti; 5.51%), resulting in poor precision, in particular for the high spatial resolution (laser spot size < 20 mm) analysis. We have developed a robust technique for determining low Ti contents in zircon using LA–ICP–MS/MS with NH3 as the reaction gas. Using an iCAP TQ ICP–MS/MS instrument (Thermo Scientific, USA), high-purity NH3 was a more effective reaction gas than the commonly used 1:9 NH3:He mixture, and a three-fold improvement in sensitivity was achieved using an N2 flow rate of 5.0 mL min−1. The products of the reactions of Ti, Ca, and Zr with NH3 were identified over a mass range of 40 to 160 amu. The reaction product 48Ti(14N1H)(14N1H3)4 (a mass shift of +83, expressed as (48 + 83)Ti) was measured to separate 48Ti+ from 48Ca+ and 96Zr2+. Interference ions 48Ca+ and 96Zr2+ have low reaction rates (~0.0046% and ~0.04%) at a mass shift of +83, and corrections are not required for glass reference materials and zircon samples. Five zircon reference materials with Ti contents of 2.5–5.0 μg g−1 were analysed, and the precision and accuracy was better than 10%. Compared with single quadrupole (SQ) mode, our method is more robust for determining low Ti contents in zircon at high spatial resolutions (laser spot size < 20 mm), making it useful for the analysis of complex zircon grains, including metamorphic zircon.

TOF Mass Spectra of Zircon M257 Measured by VUV Laser Desorption Ionization

Violet laser TOF mass spectra study on multiphoton ionization of tetramethylsilane

Note: Deep Ultraviolet Raman Spectrograph with the Laser Excitation Line Down to 177.3 Nm and Its Application

Single-Photon Ionization Mass Spectrometry Using a Vacuum Ultraviolet Femtosecond Laser

An Angle-resolved TOF Study on the UV Laser Ablation of Tantalum Oxide

Melting curve of elemental zirconium

Robust determination of low Ti contents in zircon using LA–ICP–MS/MS with NH3 reaction gas

Multiphoton ionization spectroscopy and mass spectral study of tetramethylsilane with violet laser radiation

Time-Resolved Quadrupole Mass Spectrometric Studies on Pulsed Laser Ablation of TiO2

A New Instrument of VUV Laser Desorption/ionization Mass Spectrometry Imaging with Micrometer Spatial Resolution and Low Level of Molecular Fragmentation.

A small high-irradiance laser ionization time-of-flight mass spectrometer.

Application of Femtosecond Laser Mass Spectrometry to the Analysis of Volatile Organic Compounds

High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer

Femtogram Detection and Quantitation of Residues Using Laser Ionization Orthogonal Time-Of-Flight Mass Spectrometry

UV laser MPI spectra and TOF mass spectra of tetramethylsilane

Measurement of the Transmission Efficiency of He-Jet Laser Time-Of-Flight Mass Spectrometer

Zirconium analysis in microscopic spent nuclear fuel samples by resonance ionization mass spectrometry

Laser nitriding of titanium surface and TOFMS (time of fight mass spectra) analysis

Laser Ionization Time-of-flight Mass Spectrometry for Direct Elemental Analysis

Time of Flight Mass Spectrometry with Direct Extraction of a Uranium Plasma

An angle-resolved TOF study on the UV laser-induced etching of InP(100) surface with chlorine