Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry
Ting Chen,Peide Yang,Wei Lang,Yunuo Chen,Wei Wang,Xiangchao Zhang
DOI: https://doi.org/10.1088/2051-672x/ad4fa9
2024-05-24
Surface Topography Metrology and Properties
Abstract:In the field of ultra-precision manufacturing and measurement, sub-aperture stitching is a widely employed technique for the measurement of complex optical components. Those influencing factors like system errors and numerical bias introduce notable stitching errors in the overlapped areas between sub-apertures, consequently degrading measurement accuracy. In addition, the surfaces forms, refractive indices, and positions are difficult to be specified simultaneously. In this paper, an integrated measurement method based on the stereo deflectometry is proposed, which can measure the surface form, refractive index, and relative position of large-aperture transparent components together. This method utilizes a Gaussian process regression model to decouple and predict the refractive index and relative positions of the upper and lower surfaces. Then, a robust sub-aperture stitching technique with an adaptive distance function is employed to correct the positioning errors of sub-apertures. The feasibility and effectiveness of this method are demonstrated. The final stitched surface results exhibit a measurement error of 320 nm and a thickness deviation of 28 μm.
materials science, multidisciplinary,engineering, mechanical,instruments & instrumentation