Reliability Analysis of Power Electronic Topology Based on Bayesian Network

Weiwei Hu,Ming Li,Tianyu Si,Xulan Zhu,Li Zhao
DOI: https://doi.org/10.1109/phm-nanjing52125.2021.9612940
2021-01-01
Abstract:A lot of evidence shows that power electronic is one of the most important and weakest parts of a complex system. Therefore, credible reliability analysis at the system level is necessary for the power electronic part of the equipment. The advantages of Bayesian Network in probability computing, bidirectional reasoning, and the processing of independent relationships of elements and the strong credibility of this method make it ideal for analyzing electronic systems. This paper introduces how to use Bayesian Networks to model power electronics topology, Bayesian inference, and complete the calculation of power electronics mean time to failure (MTTF) and the determination of weak links. Finally, a case study of interleaved DC-DC boost converter will describe in detail how to use Bayesian Network to calculate the reliability and mean time to failure of electronic circuits.
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