Graphene-based Thin-Films for Flexible Applications Inspected by High-Resolution Terahertz Near-Field Inspection
Simon Sawallich,Burkay Uzlu,Martin R. Lohe,Jimin Lee,Alexander Michalski,Martin Otto,Zhenxing Wang,Daniel Neumaier,Michael Nagel,Max C. Lemme
DOI: https://doi.org/10.1109/irmmw-thz50926.2021.9567276
2021-01-01
Abstract:Terahertz (THz) inspection is among the most versatile tools to perform non-destructive, quantitative characterization of conductive thin-films. In this work we apply high-resolution THz near-field measurements for the inspection of graphene-based thin-films for flexible applications. We show and discuss sheet resistance results for wafer-scale CVD-grown graphene as well as for conductive thin-films produced from dispersions of exfoliated graphene-flakes on various substrates.
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