High-Performance Flexible Transparent Conductive Films Enabled by a Commonly Used Antireflection Layer
Liwen Zhang,Ya Liu,Liangliang Li,Liubiao Zhong,Ke Wang,Wei Gan,Yejun Qiu
DOI: https://doi.org/10.1021/acsami.0c16542
2020-12-22
Abstract:Recently, silver nanowire-based transparent conductive films (AgNW-based TCFs) with excellent comprehensive performance have aroused wide and great interest. However, it is always difficult to simultaneously improve the performances of TCFs in all aspects. In this work, by introducing silica nanoparticles (SiO<sub>2</sub>-NPs) with a smaller particle size, several properties of AgNW-based TCFs were optimized successfully. The transmittance and conductivity were improved simultaneously, and smaller particle size was proven to be more suitable to achieve TCFs with excellent optoelectrical properties. Typically, an AgNW/SiO<sub>2</sub>-based TCF with a sheet resistance of 250 Ω/sq and transmittance of 93.6% (including the poly (ethylene terephthalate) substrate, abbreviated as PET) could be obtained by using SiO<sub>2</sub>-NPs with a size of ∼21 nm, and this transmittance is even higher than that of the bare PET (91.8%) substrate. We demonstrated that the layer formed through self-assembly of SiO<sub>2</sub>-NPs can cut down the light scattering on the AgNW surface through total reflection, thus leading to a low haze of AgNW/SiO<sub>2</sub>-based TCFs. Very interestingly, the SiO<sub>2</sub>-NPs conducted away most of the heat generated during laser ablation, protecting the AgNWs from excessive melt and PET from empyrosis, and thus ensuring the TCFs with high transmittance and patterning accuracy. Besides, AgNW/SiO<sub>2</sub>-based TCFs have smaller surface roughness, better flexibility, and adhesive force. To the best of our knowledge, the comprehensive performance of the AgNW/SiO<sub>2</sub>-based TCFs reaches the highest level among recently reported novel TCFs.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c16542?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c16542</a>.Schematic depiction of the measurement of transmittance; detailed parameters used for simulation; SEM/TEM images of SiO<sub>2</sub> nanoparticles with different diameters, optical photo of corresponding SiO<sub>2</sub> solution, SEM/TEM image of AgNWs used in this study, and XRD pattern/EDX spectrum of SiO<sub>2</sub>; cross-sectional SEM image of AgNW/SiO<sub>2</sub>-based TCFs and TEM image of the mixture of SiO<sub>2</sub>-NPs and AgNWs; variation of the refractive index of the silica nanoparticle-constructed film along with the increase of wavelength; the refractive index of different materials at 550 nm; comparison of properties of TCFs reported in this work and literatures; SEM and AFM characterization results of the PET substrate; SEM image of AgNW/SiO<sub>2</sub>-based TCFs with different SiO<sub>2</sub>-NP diameters; T4 and T2 curves of TCFs in the range of 300–800 nm by using different concentration of SiO<sub>2</sub>-NPs; light path analysis and light scattering calculation on AgNWs in different situations; SEM images of AgNW-based and AgNW/SiO<sub>2</sub>-based TCFs with different ablation spacing; SEM images of the cross position, the corresponding PET substrate morphology, and schematic showing heat conduction; characterization of the conductivity at different positions for a AgNW/SiO<sub>2</sub>-based TCF; influence of bending and tape peeling cycles on conductivity of TCFs and SEM images of TCFs after experiencing bending and tape peeling tests; schematic structure and optical photo of a capacitive touch screen by using AgNW/SiO<sub>2</sub>-based TCFs (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c16542/suppl_file/am0c16542_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology