An Estimation For Complex Index Of Refraction Based On Active Polarized Reflection Measurement

Kai Wang,Hong Liu,Weijun Zhong,Xiuxing Zhang,Fengqi Guo
DOI: https://doi.org/10.1016/j.optcom.2021.127170
IF: 2.4
2021-01-01
Optics Communications
Abstract:An estimation method for complex index of refraction based on polarized reflection measurement under active illumination is presented. In this method the ratio of pBRDF (polarized Bidirectional Reflection Distribution Function) matrix elements f(10)/f(11) given by active polarized reflection measurement is chosen as the new index for least squares approximation to estimate the complex index of refraction n and k of the illuminated materials, without the problem of inaccuracies and complexities in existing methods. Validation of this method is given by the measurement of two coating samples and two metal materials, which shows that this method can precisely estimate the complex index of refraction of the samples. The estimation error is decreased to less than 13% of the existing methods so that the estimation precision is significantly improved. We believe that this method will enable us to further characterize materials by polarization and accelerate the development of polarized detection and recognition.
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