Abstract:Atomic-scale characteristics of surfaces dictate the principles governing numerous scientific phenomena ranging from catalysis to friction. Despite this fact, our ability to visualize and alter surfaces on the atomic scale is severely hampered by the strict conditions under which the related methods are operated to achieve high spatial resolution. In particular, the two prominent methods utilized to achieve atomic-resolution imaging - scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) - are typically performed under ultrahigh vacuum (UHV) and often at low temperatures. Perhaps more importantly, results obtained under such well-controlled, pristine conditions bear little relevance for the great majority of processes and applications that often occur under ambient conditions. As such, a method that can robustly image surfaces on the atomic scale under ambient conditions has long been thought of as a "holy grail" of surface science. Here, by way of a proof-of-principle measurement on molybdenum disulfide (MoS2), we report that the method of conductive atomic force microscopy (C-AFM) can be utilized to achieve true atomic-resolution imaging under ambient conditions as proven by the imaging of a single atomic vacancy, without any control over the operational environment or elaborate sample preparation. While the physical mechanisms behind this remarkable observation are not elucidated yet, our approach overcomes many of the classical limitations associated with STM and NC-AFM, and the findings herald the potential emergence of C-AFM as a powerful tool for atomic-resolution imaging under ambient conditions.

Noncontact Atomic Force Microscopy: Bond Imaging and Beyond

Contribution of Chemical Bonding to the Force in Atomic Force Microscopy

Research Progress in Atomic Resolution Microscopy

Probing the Nature of Chemical Bonds by Atomic Force Microscopy

Real-space Identification of Intermolecular Bonding with Atomic Force Microscopy.

A compact CCD-monitored atomic force microscope with optical vision and improved performances.

A novel electrochemical atomic force microscope and its applications

A Novel Atomic Force Microscope with High Stability and Scan Speed

A Large-Sample Atomic Force Microscope Observing in Both Air and Liquid

True Atomic-Resolution Imaging under Ambient Conditions via Conductive Atomic Force Microscopy

Advances in Atomic Force Microscopy: Weakly Perturbative Imaging of the Interfacial Water

A Novel Atomic Force Microscope Operating in Liquid with Open Probe Unit and Optimized Laser Tracking System

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

A Horizontal Atomic Force Microscope and Its Applications

Atomic Force Microscope in Liquid with A Specially Designed Probe for Practical Application

Chapter 5 Structural Biology with Cryo-AFMs and Computational Modeling

Intramolecular Force Mapping at Room Temperature

High-resolution imaging and nano-manipulation of biological structures on surface.

Recent Progress of Imaging Chemical Bonds by Scanning Probe Microscopy: A Review

Automated Structure Discovery in Atomic Force Microscopy

Cryo-temperature Atomic-Force Microscopy: Instrumentation and Application