Optimization Of The Electron Gun With A Permanent Ion Trap

Wei Lei,Xiaobing Zhang,Daniel Den Engelsen

2004-01-01

Abstract:The impregnated cathodes(I-cathode) in a CRT are rather sensitive to ion bombardment than the oxide cathodes. If an I-cathode is subjected to ion bombardment, the electron emission can decrease, i.e. the emission slumps. As indicated in [1], an ion trap is introduced to eliminate the differences of the ion bombardment between the center cathode and the side cathode. Unfortunately, the electron trajectories are also influenced by the ion trap. As results, a few additional aberrations are introduced and the spot profile becomes worse.In this paper, the structure of the permanent ion trap is optimized. After the optimization design, the principal trajectories for both center beam and side beam are almost have their original status at the entrance of the main lens. A good compromise has obtained between the ion shielding and electron beam focusing.