A Background Calibration Technology for Capacitance Mismatch in Pipelined Adcs with 2.5-Bit/stage Mdac

Hai-Bin Li,Rui Li,Bing-Yan Hu,Tao Jiang,Yu-Chun Chang
DOI: https://doi.org/10.1109/icsict.2016.7999081
2016-01-01
Abstract:In traditional pipelined ADCs, errors originated by capacitance mismatch, finite amplifier gain, incomplete settling and offset. To overcome capacitance mismatch for >=2.5-bit/stage MDAC architecture, a new background digital calibration strategy is proposed in this paper. Based on this technique, a 14-bit, 40MS/s pipelined ADC is implemented. The simulation results show that ENOB is improved from 9.7 bits to 13.3 bits with G=0.5% capacitance mismatch within 1s. The chip is fabricated in 0.18um CMOS process, occupied an active area of 4x4mm2, including on-chip decouple capacitors, with 110mW power consumption at 3.3 V.
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