Modal Inspection Technology Based On Transverse Second Harmonic Generation In Single Nonlinear Micro/Nanowaveguide

C. G. Xin,Y. R. Zhou
DOI: https://doi.org/10.1117/12.2587429
2020-01-01
Abstract:We demonstrate a method based on transverse second harmonic generation (TSHG) for in-situ modal inspection of single nonlinear micro/nanowaveguide. CdS nanobelts (NBs) with width of several micrometers and length of a few hundred micrometers are synthesized by a thermal evaporation process. Transverse second harmonic (TSH) signal is observed as pumping light coupled inside a single CdS NB from both ends simultaneously. As a result of multimode interference, periodic interference patterns are observed along the whole NB. The influence of multimode interaction on TSHG effect inside single nonlinear micro/nanowaveguide is studied both theoretically and experimentally. Using fast Fourier transform (FFT), the TSH patterns are analyzed. The results indicate several particular modes inside the NB, which is in great well with calculated results. The method can be in principle operated in varieties of nonlinear micro/nanowavegudies including ZnO, CdS, CdTe, GaAs and LiNbO3.
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