Unstable Electrical Contact Behaviors At Nanoscale For Mems Switch

Wanbin Ren,Cheng Chang,Yu Chen,Shengjun Xue,Guofu Zhai
2016-01-01
Abstract:Reliable and long lifetime electrical contact is a very important issue in the field of MEMS switch and energy conversion applications. In this paper, the initial unstable contact phenomena under the conditions of micronewton scale contact force and nanometer scale contact gap has been experimentally observed. The repetitive contact bounces at nanoscale are determined by the measured instantaneous waveforms of contact force and contact voltage. Moreover, the corresponding physical model for describing the competition between the electrostatic force and the restoring force of the mobile contact is present. And then the dynamic process of contact closure is explicitly calculated with the numerical method. Finally, the effect of spring rigidness on the unstable electrical contact behaviors is investigated experimentally and theoretically. This paper highlights that in a MEMS switch a minimal actuation velocity is required to prevent contacts from bouncing.
What problem does this paper attempt to address?