Passive Binary Defocusing for Large Depth 3D Measurement Based on Deep Learning.

Yueyang Li,Junfei Shen,Zhoujie Wu,Qican Zhang
DOI: https://doi.org/10.1364/ao.432085
IF: 1.9
2021-01-01
Applied Optics
Abstract:Phase-shifting profilometry (PSP) based on the binary defocusing technique has been widely used due to its high-speed capability. However, the required adjustment in projector defocus by traditional method is inaccurate, inflexible, and associated with fringe pitch. Instead of manual defocusing adjustment, a passive defocus of the binary patterns based on deep learning is proposed in this paper. Learning the corresponding binary patterns with a specifically designed convolutional neural network, high-quality three-step sinusoidal patterns can be generated. Experimental results demonstrate that the proposed method could reduce phase error by 80%-90% for different fringe pitches without projector defocus and outperform the traditional method by providing more accurate and robust results within a large measuring depth.
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