Phase error analysis and compensation for phase shifting profilometry with projector defocusing

Dongliang Zheng,Feipeng Da,Qian Kemao,Hock Soon Seah

DOI: https://doi.org/10.1364/ao.55.005721

IF: 1.9

2016-07-18

Applied Optics

Abstract:Phase shifting profilometry (PSP) using binary fringe patterns with projector defocusing is promising for high-speed 3D shape measurement. To obtain a high-quality phase, the projector usually requires a high defocusing level, which leads to a drastic fall in fringe contrast. Due to its convenience and high speed, PSP using squared binary patterns with small phase shifting algorithms and slight defocusing is highly desirable. In this paper, the phase accuracies of the classical phase shifting algorithms are analyzed theoretically, and then compared using both simulation and experiment. We also adapt two algorithms for PSP using squared binary patterns, which include a Hilbert three-step PSP and a double three-step PSP. Both algorithms can increase phase accuracy, with the latter featuring additional invalid point detection. The adapted algorithms are also compared with the classical algorithms. Based on our analysis and comparison results, proper algorithm selection can be easily made according to the practical requirement.

optics