Direct Visualization and Manipulation of Stacking Orders in Few-Layer Graphene by Dynamic Atomic Force Microscopy.

Hongjian Wu,Xiaoxiang Yu,Mengjian Zhu,Zhihong Zhu,Jianyu Zhang,Sen Zhang,Shiqiao Qin,Guang Wang,Gang Peng,Jiayu Dai,Kostya S. Novoselov
DOI: https://doi.org/10.1021/acs.jpclett.1c01579
IF: 6.888
2021-01-01
The Journal of Physical Chemistry Letters
Abstract:Stacking order plays a central role in governing a wide range of properties in layered two-dimensional materials. In the case of few-layer graphene, there are two common stacking configurations: ABA and ABC stacking, which have been proven to exhibit dramatically different electronic properties. However, the controllable characterization and manipulation between them remain a great challenge. Here, we report that ABA- and ABC-stacked domains can be directly visualized in phase imaging by tapping-mode atomic force microscopy with much higher spatial resolution than conventional optical spectroscopy. The contrasting phase is caused by the different energy dissipation by the tip-sample interaction. We further demonstrate controllable manipulation on the ABA/ABC domain walls by means of propagating stress transverse waves generated by the tapping of tip. Our results offer a reliable strategy for direct imaging and precise control of the atomic structures in few-layer graphene, which can be extended to other two-dimensional materials.
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