Abstract:Organic thin films usually feature vertical phase segregation, and film-depth-dependent light absorption spectroscopy is an emerging characterization method to study the vertical phase separation of active layer films in organic electronics field. However, the interference effects on thin films can lead to optical errors in their characterization results. In this work, the interference effects on fluctuations of peak intensity and peak position of film-depth-dependent light absorption spectroscopy are investigated. Subsequently, a numerical method based on inverse transfer matrix is proposed to obtain the optical constants of the active layer through the film-depth-dependent light absorption spectroscopy. The extinction coefficient error in the non-absorbing wavelength range caused by interference effect is reduced by ∼95% compared with the traditional film-depth-dependent light absorption spectroscopy measurement. Thus, the optical properties of the thin film and quantitative spectrographic analysis based on these optical constants largely avoid the effects of interference including fluctuations of peak intensity and peak position. It is concluded that for many morphologically homogenously films, the spatial (film-depth) resolution of this film-depth-dependent light absorption spectroscopy can be optimized to be <1 nm. Subsequently, this modified film-depth-dependent light absorption spectroscopy approach is employed to simulate the local optical properties within devices with a multilayer architecture.

INTRODUCTION SEVERAL PROBLEMS IN THE THIN FILM INTERFERENCE PHENOMENON

Spatial Dispersion of Optical Thin Films

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Research on Automatic Recognition Technology for Interference Fringes in Measurement of Thin Film Thickness

Analysis and simulation of diffractive imaging field in thick film photoresist by using angular spectrum theory

Optical interference on the measurement of film-depth-dependent light absorption spectroscopy and a correction approach.

Interference-Aided Spectrum-Fitting Method for Accurate Film Thickness Determination

Slow Light Phenomenon and Its Theory in Thin Film Media

AN ANALYSIS OF FRACTURE MECHANISM FOR CONDUCTING POLYTHIOPHENE THIN FILMS

A physics investigation on impedance matching theory in microwave absorption film. II. Problem analyses

Progress in Infrared Transparencies under Opto Electro Thermo and Mechanical Environments

A PRECISE AND SIMPLE METHOD, THE RELATIVE TRANSMISSION FRINGE DEPTH METHOD, OF DETERMINING THE OPTICAL-CONSTANTS AND THICKNESS OF THIN SEMITRANSPARENT FILMS

A Review of Thin-film Thickness Measurements using Optical Methods

Intensity Shift Correction for Thin Film Optical Parameter Determination

3D FUNDAMENTAL SOLUTION FOR A CONCENTRATED FORCE ACTED AT THE INTERIOR OF A THIN-FILM COATING LAYER

Modeling of Near-Field Optical Diffraction from a Subwavelength Aperture in a Thin Conducting Film.

FUNDAMENTAL AREAS OF PHENOMENOLOGY (INCLUDING APPLICATIONS): Multi-Slit Diffraction of Evanescent Electromagnetic Waves

A REVIEW ON THIN FILMS FALLING ALONG AN INCLINED PLANE

Optical-Properties of Extremely Thin-Films - Studies Using Atr Techniques

Measuring Thin Films Using Quantitative Frustrated Total Internal Reflection (FTIR)

Spatial Effect on the Interference of Light Propagated in a Film Structure.