Abstract:An accurate description of the electromagnetic properties of materials is fundamental to optical and electric devices. As a current research hotspot, thin slabs generally are modeled as a film of finite thickness with a dielectric function. However, inspired by two-dimensional materials, thin slabs can be regarded as surface current sheets with conductivity. Due to the convenience of the latter in simplifying the calculations, it becomes increasingly significant to determine the equivalent conditions of the two models. In this work, we compare the differences between the thin film and surface current models in calculating the transmissivity, reflectivity, and absorptivity of a SiC film. For normal incidence, the difference between the calculations of the two models is only non-negligible when the thickness is large (500 nm), because of the invalidation of surface current models and the excitation of Fabry-Perot resonance. In particular, we derive analytical formulas for the relative error in transmittance versus phase difference, which can be used to predict the difference between the two models as a function of film thickness. For oblique incidence, the two models have significant differences in the vicinity of epsilon-near-zero (ENZ) frequency. The excitation of the Berreman leaky mode in a thin film model causes a narrow blank absorption peak close to the ENZ frequency. However, we found that the surface current model is unable to form this resonance mode and further demonstrate it theoretically. In addition, it is found that the two models are equivalent in the case of a transverse electric wave even though the incidence is oblique. This work can enhance the awareness of the light-matter interaction and open unprecedented avenues for designing ultrathin optical devices.

Modeling of Near-Field Optical Diffraction from a Subwavelength Aperture in a Thin Conducting Film.

Near-Field Optical Thin Microcavity Theory

Study on the property of subwavelength imaging in a metal thin-film structure

Diffraction of a small aperture - near-field optics theory

The near-zone field characteristics of an E-polarization plane wave penetrating through cylindrical multiple apertures (non) coated with lossy and lossless media

Extraordinary optical diffraction from hole pair based on near-field optical thin-microcavity theory

A rigorous theory on electromagnetic diffraction by a planar aperture in a perfectly conducting screen

3D modelling of macroscopic force-free effects in superconducting thin films and rectangular prisms

Near-field Properties of Diffraction Through a Circular Subwavelength-Size Aperture

Boundary Diffraction Method for Aperture Near-Field Diffraction

Notes on “Analytical Model for Low-Frequency Magnetic Field Penetration Through a Circular Aperture on a Perfect Electric Conductor Plate”

Mathematical Theory for Electromagnetic Scattering Resonances and Field Enhancement in a Subwavelength Annular Gap

Gaussian diffraction model for Sb thin films in super-resolution near-field structure

Mathematical Modeling of Near-Field Optics

Measurement Of Thin Cylinder Diameter By Optical Diffraction

Improvement of Surface Waves Attenuation Performance with A Magnetic Thin Film Loading

An Approach for Calculating Arbitrary-Order Diffraction Through Hole-Array Based on Thin Microcavity Theory

Novel Optical Super-Resolution Pattern with Upright Edges Diffracted by a Tiny Thin Aperture.

Convergence Analysis in Near-Field Imaging

Design and Analysis of Bow Tie Aperture with Strong Near-Field Enhancement Effect

Comparative analysis of two models for the optical response of a thin slab: a film of finite thickness versus a surface current sheet