Automatic and accurate determination of atom peak location in high-resolution electron microscopy image and fast visualization of polarization domains

Hu NAN,Jiang-bo LU,Ming LIU,Hong-mei JING,Shao-jie TANG,Da-wei WANG,Chun-lin JIA
DOI: https://doi.org/10.3969/j.issn.1000-6281.2016.03.001
2016-01-01
Abstract:Quantitative analysis of high-resolution ( scanning ) transmission electron microscopy images is becoming increasingly important. Here, we develop computer programs for efficiently processing high-resolution micrographs, automatically constructing Bravais lattice and extracting peak positions of atoms, and therefore substantially reduced the workload in analyzing such images. The program has been applied to (i) estimating the periodic displacements of atoms in LaBaCo2O5.5+δ; (ii) visualizing the nanoscale domain structures of ferroelectric PbTiO3;and ( iii) obtaining the distribution of the tetragonal ratio c/a of individual cells in PbTiO3 . We demonstrated that such a tool is useful for the study of materials on the nano and atomic scale, and for comparing simulated and experimental images, which also constitutes the basis for future automatic matching of experimental and simulated high-resolution electron microscopy images.
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