Measurement and Compensation of DLP Projector Light Intensity for Mask Projection Stereolithography

Zhihui QIU,Hao CHEN,Qi HUANG,Chenyu DAI
DOI: https://doi.org/10.7652/xjtuxb201708013
2017-01-01
Abstract:A novel method is proposed to solve inhomogeneous light distribution existing in DLP projector by inserting a calibration mask into the upper-computer software.An automatic data acquisition equipment with UV light sensor,Arduino and stepping motors is invented,where the designed strategy is able to improve UV sensor precision to ± 10-5 W/cm2.This system directly collects calibration mask gray data according to the feedback of light sensor,establishes mathematical model of the mask,and draws it with Qt setPixel function,which significantly improves work efficiency.The calibration results of this system are verified by measurement and experiment.DLP projector light intensity range is diminished from 5 × 10-4 W/cm2 to 5 × 10-5 W/cm2.For the photosensitive resin,the negative impact of inhomogeneous light intensity can be reduced at the forming accuracy of 0.1 mm.
What problem does this paper attempt to address?