Abstract:Two-dimensional (2D) layered materials have attracted widespread research interest and have significantly promoted the development of chemistry, material science, and condensed matter physics. Since the emergence of graphene, 2D materials with unique mechanical, thermal, optical, and electrical properties have been developed. In the case of graphene, its extraordinary mechanical strength, carrier mobility, thermal conductivity, and light -absorption over the whole spectral range in UV-Vis and near infrared guarantee a wide range of prospective applications. The electronic structure and properties of graphene flakes are dominated by their thickness, twist angle, and dielectric environment. Tailoring the interlayer interactions of graphene layers can provide additional opportunities for developing optical and electrical nanodevices, resulting in pioneering outcomes, such as the magic -angle graphene. Over the past decade, one of the most active research directions in the field of 2D materials has been the development of novel techniques that can probe the thickness -dependent physical properties of layered materials. In contrast with the intensively studied mechanical, electrical, and optical properties, microscopic investigations of the thermal characteristics of graphene flakes remain to be explored. Photothermal (PT) microscopy is a new all -optical microscopic imaging technique that has gained substantial attention and undergone long-term development in recent years, especially in the fields of nanomaterials and life sciences. The fundamental principle of PT microscopy is to heat the target sample based on the absorption of a heating beam and use a probe beam to indirectly capture information on microscale heat generation and transport. Inspired by several pioneering studies, we conducted a comparative study of the thickness -dependent PT properties of mechanically exfoliated graphene flakes in two different PT media, i.e. , air and glycerol. Whereas a nonlinear relationship between the PT intensity and sample thickness was observed in both media, the PT intensities from the two media were distinct. A highcontrast and non -monotonic PT response was observed in glycerol. The PT intensity of monolayer graphene was higher than that of bilayer graphene, and the PT intensities of graphene flakes with 2-4 layers exhibited a good linear relationship with the thickness. We also analyzed the relationship between the PT intensity and heating or probe power, demonstrating that the PT intensity as well as the absorption cross-section of graphene derived from the PT signal vary linearly with the power of both laser beams. Our study provides insights into light absorption and thermal relaxation features of graphene flakes of different thicknesses, which can guide future studies on the thermal properties of layered materials and their heterostructures.

The Measurement of Single-layer Thickness of Graphene Materials byHigh Resolution Transmission Electron Microscopy

Effects of Non-Rotationally Symmetric Aberrations on the Quantitative Measurement of Lattice Positions in a Graphene Monolayer Using High-Resolution Transmission Electron Microscopy

Resolving the Individual Carbon Atoms of Graphene Monolayer by REW Software

Accurate thickness measurement of graphene

A simple TEM method for fast thickness characterization of suspended graphene flakes

Optical Transmittance of Multilayer Graphene

Spectroscopic Metrics Allow in Situ Measurement of Mean Size and Thickness of Liquid-Exfoliated Few-Layer Graphene Nanosheets

Scaling the Dynamic Electron Scattering in Imaging the Graphene Sheets by the High-Angle Annular Dark-Field Microscopy.

Dark-field transmission electron microscopy and the Debye-Waller factor of graphene

Free-standing graphene by scanning transmission electron microscopy

Z-contrast Atom Counting Using the Few-Layer Graphene Sheets

Structure of Graphene studied by transmission electron microscopy

High contrast imaging and thickness determination of graphene with in-column secondary electron microscopy

Unveiling the Thickness-Dependent Mechanical Properties of Graphene Papers by in Situ SEM Tension.

High-Resolution Scanning Tunneling Microscopy Imaging of Mesoscopic Graphene Sheets on an Insulating Surface

Thickness measurements of graphene oxide flakes using atomic force microscopy:Results of an international interlaboratory comparison

Measurement Accuracy Of The Diameter Of A Carbon Nanotube From Tem Images

Centimeter-scale high-resolution metrology of entire CVD-grown graphene sheets.

Nondestructive Andin Situdetermination of Graphene Layers Using Optical Fiber Fabry–Perot Interference

Auger Electron Spectroscopy: a Rational Method for Determining Thickness of Graphene Films.

Photothermal Microscopy of Graphene Flakes with Different Thicknesses