Design of an On-line High Temperature Dielectric Property Measurement System

Wei-quan MA,Zi-li HU,Li WU
DOI: https://doi.org/10.16540/j.cnki.cn11-2485/tn.2018.02.08
2018-01-01
Abstract:In this paper,an on-line high temperature dielectric property measurement system based on a ridge waveguide is proposed under the frequency of 2450 MHz.The FDTD simulation (finite difference-time-domain) and neural network algorithm are combined to reverse the complex permittivity of the material.For using convenience,a data acquisition deviceis adopted to collect data during measurement process,and a man-machine interaction interface is programmed to achieve auto measurement.The reliability of this system is verified by some common materials at room temperature,and the system is used to measure the dielectric property of laterite ores under dynamic temperatures.
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