Transient Characteristics Of Secondary Electron Yield Based On Charging Balance Mode

Feng Guobao,Li Jun,Cui Wanzhao,Liu Chunliang,Cao Meng
DOI: https://doi.org/10.16708/j.cnki.1000-758X.2017.0030
2017-01-01
Chinese space science and technology
Abstract:The essential relationship between secondary electrons emission and charging states of dielectric was investigated based on charging balance mode with numerical simulation. Both Monte Carlo and finite-difference time-domain algorithms were adopted for numerical simulation, considering elastic and inelastic essential between incident electrons and material atoms during scattering process and calculating diffusion, drift and trap effects of internal charges. Under different charging balance modes, the secondary electron emission and charging states of dielectric on transient change, internal distributions and saturation values were analyzed and simulated. The results show that charging balance modes can be divided into the secondary electron (SE) mode, the leakage electron (LE) mode and the combined (CO) mode. The SE mode corresponds to the surface charging state, while the LE mode corresponds to the deep charging state. When the charging balance mode changes towards SE mode from LE mode, both the secondary electron yield and the negative surface potential increases, while variation trends of the total charging quantity and charging time constant present to be opposite as a result of balance mode change.
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