Abstract:With the development of 5G technology, the accurate measurement of the complex permittivity of a printed circuit board (PCB) in the wide frequency range is crucial for the design of high-frequency circuits. In this paper, a microwave measurement device and method based on the double-sided parallel-strip line (DSPSL) resonator have been developed to measure the complex permittivity of typical PCBs in the vertical direction. The device includes the DSPSL resonator, the DSPSL coupling probe, a pressure monitor, a Farran C4209 vector network analyzer (100 K to 9 GHz), and a FEV-10-PR-0006 frequency multiplier (75–110 GHz). Based on transmission line theory, the physical model of the DSPSL resonator was established, and the relative permittivity and loss angle tangent value of the dielectric substrate were calculated using conformal transformation. To excite the resonator, the DSPSL coupling probe with a good transmission effect was designed, which consists of DSPSL microstrip line (MSL) transition structure and an MSL-WR10 rectangular waveguide converter. To reduce the air gap between the sample and the metal guide band and dielectric support block, and to improve test accuracy, a mechanical pressure device is added to the top of the DSPSL resonator. Based on the DSPSL resonator, we have used the device to test four typical PCBs, namely, polytetrafluoroethylene, Rogers RT/duroid®5880, Rogers RO3006®, and Rogers RO3010®. The results show that the maximum error of the relative permittivity is less than 3.05%, and the maximum error of the loss angle tangent is less than 1.27 × 10−4.

Broadband Measurement of Substrate Complex Permittivity Using Optimized ABCD Matrix.

Ungrounded Coplanar Waveguide Based Straight Line Methods for Broadband and Continuous Dielectric Characterization of Microwave Substrates

An Enhanced Broadband Continuous Extraction Approach for Complex Propagation Constants of Differential Transmission Lines

Investigation on the Measurement of Complex Permittivity of Substrate of Microwave Printed Circuit Board

High-Order Mode-Matching-Based Single-Cavity Coaxial Transducer for Broadband Measurement of Complex Permittivity

Single-Length and On-Wafer Probe-Based Broadband and Rapid Characterization of Substrate Dielectric Constant for Aerospace Applications

Broadband Measurements of the Surface Impedance in Ferromagnetic Wires As a Boundary Condition for Scattering Problems

An Automatic System for Complex Permittivity Measurement of LowLoss Materials at X Band

Simple, Fast, and Accurate Broadband Complex Permittivity Characterization Algorithm: Methodology and Experimental Validation from 140 GHz Up to 220 GHz

A Method to Determine Broadband Complex Permittivity of Thin Film Dielectric Materials up to 60 GHz

Attenuation Measurement of the Dielectric Rod Using Parallel Strips with a Resonable Field Environment

Multiband Permittivity Measurement of Metallized-Bulk Substrate With Negative Group Delay-Based Ring Resonator

Extraction of the Complex Permittivity of PCB

Broadband Complex Permittivity Determination Using A Two-Port U-Shaped Coplanar Waveguide With Artificial Neutral Network Algorithm

Permittivity measurement of high-frequency substrate based on the double-sided parallel-strip line resonator method

An Optimization Technique for Deriving Dielectric Characterization of Microwave Substrates

110-150 GHz Permittivity Extraction of Silicon Substrate in 3D TSV-MEMS Process

Design Method of Multi-Sine Signal for Broadband Impedance Measurement Considering Frequency Coupling Characteristic

Measurement with Sweeping Frequency for Complex Permittivity Based on VNA

Broadband complex permittivity and conductivity measurements in the millimeter-wave bands over variable temperatures using a balanced-type circular disk resonator

Extraction of Dielectric and Rough Conductor Loss of Printed Circuit Board Using Differential Method at Microwave Frequencies