Imaging Nucleation, Growth and Disorder at the Single-atom Level by Atomic Electron Tomography (AET)

Peter Ercius,Jihan Zhou,Yongsoo Yang,Yao Yang,Dennis Kim,Andrew Yuan,Xuezeng Tian,Colin Ophus,S Zhu,Andreas Schmid,Michael Nathanson,Hendrik Heinz,Qi An,Hao Zeng,Jianwei Miao
DOI: https://doi.org/10.1017/s1431927620019583
IF: 4.0991
2020-01-01
Microscopy and Microanalysis
Abstract:ordered phases as well as the prospects for solving amorphous structures. We will show the imaging of grain boundaries, chemical species swap defects and point defects. We will also show nucleation, growth, merging and dissolution of the L1 0 phase of FePt from an initially disordered A1 phase. Finally, the presentation will look forward to more advanced phase contrast methods utilizing the recent capabilities of scanning nano-diffraction (also known as 4D-STEM) such as differential phase contrast and ptychography beyond ADF-STEM. Such methods will enable imaging of low-Z atoms simultaneously with high-Z atoms and at lower doses. We expect AET to be an important method in materials science to solve the atomic structure of complex materials without the assumption of crystallinity.
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