Diffraction Based Method to Reconstruct the Spectrum of the Thomson Scattering X-Ray Source
Zhijun Chi,Lixin Yan,Zhen Zhang,Zheng Zhou,Lianmin Zheng,Dong Wang,Qili Tian,Wei Wang,Zan Nie,Jie Zhang,Yingchao Du,Jianfei Hua,Jiaru Shi,Chihao Pai,Wei Lu,Wenhui Huang,Huaibi Chen,Chuanxiang Tang
DOI: https://doi.org/10.1063/1.4981131
IF: 1.6
2017-01-01
Review of Scientific Instruments
Abstract:As Thomson scattering x-ray sources based on the collision of intense laser and relativistic electrons have drawn much attention in various scientific fields, there is an increasing demand for the effective methods to reconstruct the spectrum information of the ultra-short and high-intensity x-ray pulses. In this paper, a precise spectrum measurement method for the Thomson scattering x-ray sources was proposed with the diffraction of a Highly Oriented Pyrolytic Graphite (HOPG) crystal and was demonstrated at the Tsinghua Thomson scattering X-ray source. The x-ray pulse is diffracted by a 15 mm (L) ×15 mm (H)× 1 mm (D) HOPG crystal with 1° mosaic spread. By analyzing the diffraction pattern, both x-ray peak energies and energy spectral bandwidths at different polar angles can be reconstructed, which agree well with the theoretical value and simulation. The higher integral reflectivity of the HOPG crystal makes this method possible for single-shot measurement.