Towards a New Quantitative Probing Tool: Merits of Combining DFT and Quantitative Electron Diraction
Jin-Cheng Zheng,Lijun Wu,Yimei Zhu
2006-01-01
Abstract:where fel(s) and fx(s) are the atomic scattering amplitudes for electron diraction and x-ray diraction, respectively, s = sin = is the scattering vector (A 1 ), Z is the charge of nucleus, and is a coecien t, equal to 0.023934 if the units of fel(s) and fx(s) are A and electron charge (e), respectively. The basic reason for the sensitivity in electron diraction is the near cancellation of the scattering from the positively charged nucleus and the negatively charged electrons. Thus, small changes in electron density lead to large changes in scattering. The well-known divergence at small scattering angles for Coulomb scattering partly overcomes the near-cancellation, leading to strong measurable scattered intensities. Fig. 1 shows the critical scattering vectors for many elements (from H to Xe), below which electron diraction is more sensitive to charge redistribution than is x-ray diraction (2). Electron diraction and x-ray diraction are complementary techniques. The latter undergoes a large extinction in low-order Bragg reections (which are sensitive to chemical bonding), but can be used to accurately measure the structure factors of high order reections (which are sensitive to atomic coordinates and temperature factors). Therefore, crystal structure and the Debye-Waller factor (related to thermal eects) can be determined by x-ray diraction. As discussed above, quantitative electron diraction enable to measure the low-order structure factors very accurately, thus providing valuable information on the distribution of valence electrons and chemical bonding. Moreover, due to the small probe size in TEM, this technique can access and measure charge distributions in nanocrystalline grains. Therefore, a combination of electron diraction and x-ray diraction will provide insight into the detailed charge distributions in functional materials (3,4). Here, we show that, beyond charge density mapping, by taking advantage of the accurate mea- surement of electron structure factors, the combination of theoretical computations (e.g., DFT based on full-potential augmented plane-wave plus local orbitals method (Wien2k package)(5)) and quantitative electron diraction can oer a unique quantitative approach for probing properties of materials. We give examples of how to apply this method to determine the charge ordering and orbital ordering in many functional materials, especially strongly correlated transition metal oxides, such as NaxCoO2, LaMnO3, etc. Further, we demonstrate that accurately measured low- order electron structure factors can be used to test rst-principles theories, especially to optimize exchange-correlation functionals, and the on-site Coulomb potential U in the LDA+U method. References