Interband Impact Ionization in THz-driven InAs/AlSb Heterostructures

Jc Cao,Xl Lei,Az Li,M Qi,Hc Liu
DOI: https://doi.org/10.1088/0268-1242/17/3/306
IF: 2.048
2002-01-01
Semiconductor Science and Technology
Abstract:Extended balance equations accounting for the conduction-valence interband impact ionization (II) process in semiconductor heterostructures are presented. The II effect and terahertz (THz) field influence on electron transport in InAs/AlSb heterostructures is studied. It is shown that the II process usually results in a decrease in electron velocity and temperature when compared to the case without the II process. Qualitative agreement is obtained between the calculated electron-hole generation rates and available experimental data. Comparison with published experimental data on THz-driven heterostructures is also made.
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