Abstract:The structure and magnetic properties of ion beam sputtered transition metal–metalloid FeCoNbB/Si(100) alloy thin film have been studied as a function of film thickness using complementary techniques of x-ray reflectivity (XRR), grazing incidence x-ray diffraction, and magneto optical Kerr effect. Thicknesses of the films range from ~200 to 1500 Å. The coercivity of all the films ranges between 4 and 14 Oe, which suggests soft magnetic nature of FeCoNbB/Si thin films. Films with thickness up to 800 Å are amorphous in nature and are found to possess uniaxial magnetic anisotropy in the film plane, although no magnetic field was applied during deposition. The presence of the two fold symmetry in such amorphous thin films may be attributed to quenched-in stresses developed during deposition. Upon increasing the film thickness to ~1200 Å and above, the structure of FeCoNbB films transforms from amorphous to partially nanocrystalline structure and has bcc-FeCo nanocrystalline phase dispersed in remaining amorphous matrix. The crystalline volume fraction (cvf) of the films is found to be proportional to the film thickness. Azimuthal angle dependence of remanence confirms the presence of in-plane four-fold anisotropy (FFA) in the crystalline film with cvf ~75%. Synchrotron x-ray diffraction measurement using area detector suggests random orientation of crystallites and thus clearly establishes that FFA is not related to texture/cubic symmetry in such polycrystalline thin films. As supported by asymmetric Bragg diffraction measurements, the origin of FFA in such partially crystalline thin film is ascribed to the additional compressive stresses developed in the film upon crystallization. Results indicate that promising soft magnetic properties in such films can be optimized by controlling the film thickness. The revelation of controllable and tunable anisotropy suggests that FeCoNbB thin films can have potential application in electromagnetic applications.

Thickness dependence of microstructures and optical properties of Mn1.56Co0.96Ni0.48O4 thin films

Structure, optical, and electrical properties of (Mn 1.56 Co 0.96 Ni 0.48 O 4 ) 1−x (LaMn 0.6 Al 0.4 O 3 ) x composite thin films

Low-temperature (<300 C) growth and characterization of single-[100]-oriented Mn-Co-Ni-O thin films

Fabrication and Properties of Mn1.56Co0.96Ni0.48O4 Free-Standing Ultrathin Chips

(1-x)Mn1.56Co0.96Ni0.48O4/xLaMnO3 (0.1≤x≤0.9): A composite NTC thin film with low resistance, high sensitivity and strong light absorption

Tuning of the Intrinsic Magnetic Damping Parameter in Epitaxial CoNi(001) Films : Role of the Band-Filling Effect

Thickness Dependent Dislocation, Electrical and Optical Properties in Inn Films Grown by Mocvd

Thickness Dependent Microstructures and Properties of Sr2Fe10/9Mo8/9O6 Films Grown in N2

Optical Properties of Small Polaron in Mn1.56Co0.96Ni0.48O4films Investigated by Temperature-Dependent Transmission Spectra

Structural and Optical Properties of Spin-Coated Mn$_3$O$_4$ Thin Films of Different Coating Layers

Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si

Effect of film thickness on the magneto-structural properties of ion beam sputtered transition metal–metalloid FeCoNbB/Si (100) alloy thin films

Peculiar thickness dependence of perpendicular magnetic anisotropy in epitaxial NiCo<sub>2</sub>O<sub>4</sub> spinel films

THICKNESS DEPENDENCE OF MORPHOLOGY IN La<sub>2/3</sub>Ca<sub>1/3</sub>MnO<sub>3</sub> THIN FILMS

Investigation of the porosity and particle size effects on the optical constants of Mn star shape thin films

Magnetic Structure Ofco1−xmnxalloys

Substrate and Thickness Effects on Structure and Transport Properties of La2/3ca1/3mno3 Films

Thickness Dependence Of Morphology In La2/3ca1/3mno3 Thin Films

Thickness-dependent Magnetic Properties in Pt/[Co/Ni] N Multilayers with Perpendicular Magnetic Anisotropy

Magnetooptic And Optical Characterization Of Tb/Co Compositionally Modulated Amorphous Films

Effects of film thickness on colossal magnetoresistance in Pr0.7Sr0.3MnO3 films