Abstract:The reliability requirements for mechatronics continue to increase. Traditional life test methods make it difficult to obtain the data required to assess or predict the reliability of these mechatronic products within a reasonable time. Accelerated life tests can speed up the failure process of the product by using accelerated stress conditions. And then test data is obtained to predict the reliable life of the product under normal service conditions through modeling and analysis. The test efficiency of the accelerated life tests is higher than that of the life test. So, the method of accelerated life tests has become a solution for life and reliability prediction of highly reliable and long‐life mechatronic products. However, mechatronic products usually undergo cyclic stress during service. The use of cyclic stress as an accelerating stress in accelerated life tests can provide a realistic representation of service conditions and achieve higher test efficiency. Cyclic stress accelerated life test is an accurate and efficient solution for predicting the life and reliability of such mechatronic products. Current relative research is focused on constant stress, step stress and sequential stress accelerated life tests. A great challenge in engineering is modeling and analysis of cyclic stresses accelerated life tests. In this paper, we first describe the cyclic stress accelerated life test profile and its key parameters, then propose model assumptions and establish a modelling and analysis method for cyclic stress accelerated life test data, followed by an illustrative example to apply and validate the proposed method. The research results can provide technical support for the life and reliability assessment of mechatronic products under cyclic stress service conditions.

Application of Reliability Growth Model in Step-Down Stress Accelerated Storage Test

Optimal design for step-stress accelerated degradation testing with competing failure modes

Storage life evaluation method based on segmented nonlinear Arrhenius model

Cyclic stress accelerated life test method for mechatronic products

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Reliability Assessment and Remaining Useful Life Prediction Based on the Inverse Gaussian Step-Stress Accelerated Degradation Data

Semiparametric evaluation of first‐passage distribution for step‐stress accelerated degradation tests

Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes

Reliability estimation for one-shot devices under cyclic accelerated life-testing

Optimal Design for Step-Stress Accelerated Test with Random Discrete Stress Elevating Times Based on Gamma Degradation Process

A General Degradation Process of Useful Life Analysis Under Unreliable Signals for Accelerated Degradation Testing

Optimal designs of accelerated degradation tests with random shock failures and measurement errors

Reliability estimation from two types of accelerated testing considering individual difference and measurement error

Design Technology of Accelerated Life Test Based on the Load Spectrum Compilation and D-efficiency

Reliability modeling and statistical inference of accelerated degradation data with memory effects and unit-to-unit variability

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testing

Reliability Calculation of Solid Propellant Based on Accelerated Degradation Test

Study on Feasibility of Storage Accelerated Testing Based on Parameter Degradation for Aerospace Relays

Development of Accelerated Reliability Test Cycle for Electric Drive System Based on Vehicle Operating Data

Integrated Approach for Field Reliability Prediction Based on Accelerated Life Testing