Effects of Ni-Doping on Microstructures and Properties of Zn-20Sn High-Temperature Lead-Free Solders

Tian Jun,Hong Li-Hua,Hong Chun-Fu,Yan Xiao-Hui,Dai Pin-Qiang
DOI: https://doi.org/10.14102/j.cnki.0254-5861.2011-2196
2019-01-01
Abstract:In the present work, the effect of Ni doping on the microstructures and properties of Zn-20Sn high temperature lead-free solder has been investigated. Interestingly, Ni was present as the form of Ni-Zn compounds in the microstructure of Zn-20Sn-xNi alloy. When the Ni-doping amount was 0.2 similar to 0.4wt.%, the presence of d phase was found, and when the doping amoun was 0.8wt.%, the presence of delta phase was observed. With the increase of Ni content, the liquidus temperature increased but the solidus temperature did not change obviously. In addition, the microhardness and electrical resistivities of Zn-20Sn-xNi solder increased gradually. And the spreading area and shear strength increased firstly but decreased afterwards. When the content of Ni was 0.4wt.%, the spreading area and shear strength of solder reached to be maximum. After the addition of 0.4 wt.% Ni, the microstructure of the interfacial intermetallic compound (IMC) layer of the interface didn't change, but the total thickness of the IMC layer reduced. The delta-phase was embedded in the grain boundary of epsilon-CuZn5, which hindered the diffusion of atoms. The thickness of IMC layer at the interface reduced, which led to the improvement of the shear strength of the interface.
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