Characterization of Rh-based Catalysts with EPR, TPR, IR and XPS

Y Wang,Z Song,D Ma,Hy Luo,Db Liang,Xh Bao
DOI: https://doi.org/10.1016/s1381-1169(99)00181-8
1999-01-01
Journal of Molecular Catalysis A Chemical
Abstract:Rh-based catalysts to be used for the synthesis of C2-oxygenates from syngas were characterized with EPR, TPR, IR and XPS methods. The chemical state of the Mn component was extensively studied with EPR after in situ reduction and treatment with various probe molecules. The results indicated that on the Mn/SiO2 catalyst, Mn can exist as isolated Mn2+ ions on the surface of SiO2 through the formation of coordination compounds with surface hydroxyls and H2O molecules as ligands. Thermal reduction of the Mn/SiO2 catalyst resulted in the migration and accumulation of the Mn2+ ions. The results of TPR, IR, XPS were consistent with those of EPR, which indicated that on a Rh–Mn/SiO2 catalyst, a Rh–Mn mixed oxide was formed, which stabilized the Rh+ species. The formation of small clusters of the Rh–Mn mixed oxide inhibited deep reduction and accumulation of the Mn component, while at the same time increased the dispersion of the Rh component. As a promoter, Mn acts as an electron acceptor, while Li exhibits an electron-donation effect. The Li component can inhibit the formation of Rh–Mn mixed oxide and increase the concentration of Rh0 on the surface of SiO2. The existence of Li may also cause the tilted-adsorption form of CO on Rh, as well as the spillover of H2 from Rh to the SiO2 support.
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