Abstract:Thin films of doped perovskite manganites of the type R1-X AxMnO3-y are currently become the focus of intense theoretical and experimental research due to their promising technological implications. However, the microstructure of the film and the interface structure at the atomic level remains unclear. In this report, we will present the atomic structure of the film/substrate interface and the microstructure of the film using a combination of transmission electron microscopy (TEM), Z-contrast scanning transmission microscopy (STEM), and electron energy loss spectroscopy (EELS).The La0.67Ca0.33MnO3 (LCMO) samples were grown on (001) LaA1O3 (LAO) using pulsed laser deposition. X-ray diffraction indicated the films to be oriented with the [001] directions parallel to the <001> directions of the pseudo-cubic perovskite LAO. Rocking curve measurements using the (002) reflection from the film indicated a full width half maximum of less than 0.3°. A Philips EM-400 electron microscope at 100 kV and a VG HB603 STEM at 300 kV were employed for sample analysis.

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Study of Structural and Electrical Transport Properties of Polycrystalline La1-XCaXMnO3 (x=0.33, 0.5 and 0.9) Prepared by a Co-Precipitation Method

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Lu-induced orthorhombic phase in polycrystalline La0.7Sr0.3MnO3

Charge Ordering Induced by Phase Separation in Polycrystalline La0.7−xLuxSr0.3MnO3 Perovskites

Rietveld Refinement of Cu Doped La_(0.67)Ca_(0.33)MnO_3 Crystal Structure

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