Detecting Surface Features on Conducting Specimens Through an Insulation Layer Using a Capacitive Imaging Technique

Xiaokang Yin,David A. Hutchins,Guoming Chen,Wei Li

DOI: https://doi.org/10.1016/j.ndteint.2012.08.004

2016-01-01

AIP Conference Proceedings

Abstract:Capacitive imaging (CI) technique is a novel electromagnetic NDE technique. It uses a carefully designed probe with a pair of metal electrodes. Interaction between the Quasi-static electromagnetic field from the electrode pair and the testing material causes changes in signal when the electrical properties of the sample themselves change, leading to the possibility of imaging. Due to its capacitive nature, the CI technique requires single side non-contact access to the testing material and little sample surface preparation. In addition, it provides a very clear and simple defect indication. Previous work [1] has demonstrated the feasibility of the CI technique to the detection of surface features on conducting specimens. It is found that the CI technique is useful to confirm the presence of a defect but cannot further characterize it due to the "blurring effect". The problem caused by the blurring effect is more significant, when trying to image smaller feature though a thicker insulation layer (comparing to the dimensions of the CI probe). This paper aims to tackle this problem using a two dimensional deconvolution method based on the analysis of the measurement sensitivity distribution. In this paper, the trade-offs between penetration depth, signal strength and imaging resolution of the CI technique are discussed. The blurring effect due to the CI probe geometry is explained. The proposed method to retrieve the real shape of the feature is then described in details, and its feasibility is also demonstrated. The results indicated that the CI technique could be useful to detect Corrosion Under Insulation (CUI).